HENNEN, Leonhard; HAHN, Julia; LADIKAS, Miltos; LINDNER, Ralf; PEISSL, Walter; VAN EST, Rinie. Technology Assessment in a Globalized World: Facing the Challenges of Transnational Technology Governance. Indian Journal of Educational Technology, India, v. 6, n. I, p. 377–378, 2024. Disponível em: https://journals.ncert.gov.in/IJET/article/view/490. Acesso em: 22 nov. 2024.